Qnity installs KLA Surfscan SP7XP wafer defect inspection system at Massachusetts facility - Q News | RalliesQnity installs KLA Surfscan SP7XP wafer defect inspection system at Massachusetts facility
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Q• Qnity expands wafer defect inspection capacity in Marlborough
- Qnity installed a KLA Surfscan SP7XP unpatterned wafer defect inspection system at its Marlborough, Massachusetts manufacturing and technology center.
- Investment expands process-control and defect-characterization capacity for advanced-node semiconductor materials development and manufacturing.
- Upgrade targets faster process learning and earlier detection of product variation to support customer roadmaps for advanced lithography materials.
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